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We present a comprehensive review of finFET devices taking into consideration different levels of interest ranging from the physics of FinFET devices, design considertaions, and applications to memory design and statistics. We start with fundamental equations that describe the advantages of finFETs in terms of leakage reduction and ON current improvement compared to planar devices. Following...
We propose a new yield estimation algorithm which estimates the acceptability region as the union of spherical cones. The algorithm works by dividing the input parameter space into approximately equi-probable cones, efficiently estimating the refined weight contributions for each cone, then combining the results to get the total yield. The algorithm is broadly similar to the worst-case-distances method,...
We propose an efficient Hermite spline-based SPICE simulation methodology for accurate statistical yield analysis. Unlike conventional methods, the spline-based transistor tables are built on-demand specific to the transient simulation requirements of the statistical experiments. Compared with traditional MOSFET table models, on-demand spline table models use ∼500X less memory. This makes Hermite...
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