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VLSI dependability is one of the most significant issues in the modern world. Here the panelists will discuss the key technologies for it as well as the cost optimization among device, design and architecture.
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can be repaired by SECDED, the block becomes vulnerable to soft errors. This paper proposes a technique to deal with the degraded resilience against soft errors. Only clean data can be stored in defective blocks of a cache....
The letter describes a new active matrix circuit that has duplicated data input routes as a means of tolerating defects and enhancing the yield of large liquid crystal displays. With this circuit, when one route is defective and the other route is not, correct data can be automatically displayed without any additional process such as defect detecting and laser repairing.
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