Search results for: H. Feng
IEEE Electron Device Letters > 2017 > 38 > 9 > 1339 - 1342
IEEE Electron Device Letters > 2016 > 37 > 5 > 684 - 687
IEEE Electron Device Letters > 2017 > 38 > 9 > 1339 - 1342
IEEE Electron Device Letters > 2016 > 37 > 5 > 684 - 687