Search results for: Han-Ping D. Shieh
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 642 - 646
SID Symposium Digest of Technical Papers > 47 > 1 > 1186 - 1188
IEEE Electron Device Letters > 2016 > 37 > 5 > 607 - 610
Thin Solid Films > 2005 > 488 > 1-2 > 211-216