Search results for: Yi Lin
IEEE Electron Device Letters > 2018 > 39 > 1 > 8 - 11
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
IEEE Electron Device Letters > 2012 > 33 > 8 > 1183 - 1185
IEEE Electron Device Letters > 2008 > 29 > 2 > 165 - 167