Search results for: W. Maly
2007 44th ACM/IEEE Design Automation Conference > 954 - 957
IEEE Design & Test of Computers > 2006 > 23 > 5 > 390 - 400
Microelectronics Reliability > 2000 > 40 > 8-10 > 1635-1640
01989 Proceedings of the IEEE Custom Integrated Circuits Conference > 1989 > 22.1/1 - 22.1/4
IEEE Design & Test of Computers > 1985 > 2 > 6 > 13 - 26
IEE Proceedings I Communications, Speech and Vision [see also IEE Proceedings-Communications] > 1985 > 132 > 1 > 13 - 16
Electronics Letters > 1983 > 19 > 6 > 226 - 227
IEE Proceedings G Circuits, Devices and Systems [see also IEE Proceedings-Circuits,... > 1980 > 127 > 6 > 255 - 259