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An X-ray reflectivity study of the silicon isobutane interface is presented. Thin isobutane films were adsorbed on a silicon wafer and their film thickness was measured as a function of pressure in order to determine the effective Hamaker constant which is a proportion of the coupling between substrate and adsorbed film. A comparison with theoretical expressions of the effective Hamaker constant is...
A kinematical scattering theory for the interpretation of X-ray photon correlation spectroscopy (XPCS) measurements from fluctuating surfaces is discussed in detail. First a general formulation without approximations is given. Then as an example XPCS measurements of capillary wave dynamics on glycerol surfaces will be presented and compared to the calculations applying the usual approximations. It...
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