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The relationship in electronics testing between the IEEE 1500 standard and the IEEE 1149.1 standards is very close, where the IEEE 1149.1 standard focuses on the testing of boards and the IEEE 1500 standard focuses on the testing of embedded cores within System on Chips (SoC) on the boards. This paper presents a novel test controller architecture that facilitates the control and access to IEEE 1500...
IEEE 1500 test wrappers that enable higher test bandwidth capability, system bus connectivity and efficient test vector organization are presented. Embedded core wrappers and test vectors that seamlessly work with ASIC and FPGA design flows are illustrated. Implementation and test-chip design show the positive impact on test time with potential for minimal wiring and logic overhead savings.
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