Search results for: Xu
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1140-1154
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 812-821
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 161-176
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 49-56
Optik - International Journal for Light and Electron Optics > 2018 > 173 > C > 220-226
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1034-1039
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1057-1063
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1155-1161
Optik - International Journal for Light and Electron Optics > 2018 > 171 > C > 891-903
Optik - International Journal for Light and Electron Optics > 2018 > 171 > C > 153-160
Optik - International Journal for Light and Electron Optics > 2018 > 171 > C > 862-868
Optik - International Journal for Light and Electron Optics > 2018 > 171 > C > 744-753
Optik - International Journal for Light and Electron Optics > 2018 > 171 > C > 754-767
Optik - International Journal for Light and Electron Optics > 2018 > 156 > C > 929-937
Optik - International Journal for Light and Electron Optics > 2018 > 156 > C > 453-458
Optik - International Journal for Light and Electron Optics > 2018 > 157 > C > 25-30
Optik - International Journal for Light and Electron Optics > 2018 > 157 > C > 429-434
Optik - International Journal for Light and Electron Optics > 2018 > 157 > C > 1087-1093
Optik - International Journal for Light and Electron Optics > 2018 > 154 > C > 441-452