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Useful yields have been measured for a series of organic compounds using Ar+, SF5+ and Bi3+ primary ion bombardment under high dose (>1013 ions/cm2) SIMS sputtering conditions on both magnetic sector and ToF‐SIMS instruments. A precision inkjet deposition system was used to produce well defined arrays of microdrops on silicon with each deposit containing a known number of analyte molecules. The...
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