The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Carbon nanotubes (CNTs) show great promise as extensions to silicon CMOS due to their excellent electronic properties and extremely small size. Using a Carbon Nanotube Field Effect Transistor (CNFET) SPICE model, we evaluate circuit-level performance of CNFET technology in the presence of CNT fabrication-related nonidealities and imperfections, and parasitic resistances and capacitances extracted...
A pulse power system (1 MV, 5 0kA, and 100 ns) based on dual polarity charged Marx generator and Blumlein pulse forming line (PFL) was built to generate high power microwaves. This paper describes the inherent prepulse present with the Blumlein configuration and the mitigation strategies adopted. Further, a qualitative attempt to verify the generation of high power microwave output on the system is...
S-parameter test structures show total capacitances per perimeter of ESD diodes increased from ~0.42fF/mum in 90nm technologies to ~0.7fF/mum in 65nm and 45nm technologies. To achieve lower capacitances for high frequency circuits, layout and process optimization are needed. SCR devices from a 45nm technology show ~0.32fF/mum and can be used for circuit applications with stringent capacitance requirement...
It is crucial to minimize the parasitic capacitance at a high-frequency I/O, found in applications such as high-speed serial links and radio receivers. Here, we study the bias-dependent capacitance of a poly-defined SOI diode-a popular ESD protection device according to C. Putnam et al. (2004), C. Entringer et al. (2005), M. Khazbinisky et al. (2005), S. Mitra et al. (2005), and S. Voidman et al....
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.