Search results for: G. Masetti
Journal of High Energy Physics > 2013 > 2013 > 7 > 1-48
Microelectronics Reliability > 1997 > 37 > 1 > 95-113
Microelectronics Reliability > 1996 > 36 > 7-8 > 955-972
Microelectronics Reliability > 1995 > 35 > 3 > 567-586