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Manufacturing and operation-induced variations have emerged as a critical challenge in designing integrated circuits (ICs) under the nanometer technology regime. Most work on addressing variations has focused on device, circuit, and logic-level solutions. As the magnitude of parameter variations increases with technology scaling, these techniques are not sufficient to address the negative impact that...
We present efficient power estimation techniques for hardware-software (HW-SW) system-on-chip (SoC) designs. Our techniques are based on concurrent and synchronized execution of multiple power estimators that analyze different parts of the SoC (we refer to this as coestimation), driven by a system-level simulation master. We motivate the need for power coestimation, and demonstrate that performing...
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