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The prospects of single drift region (SDR), flat profile GaN IMPATT diode as terahertz source are studied through a simulation experiment. The study indicates that GaN IMPATT device is capable of generating high RF power (PRF) of 14.4 W at around 0.7 THz with an efficiency of 20.0 %. The effects of photo-illumination on the GaN device is also investigated using a modified double iterative simulation...
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