The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The results of radiation tests of microcontrollers of the ATmega-128 type in a wide range of dose rates and temperatures have been used to estimate the probability of no-failure operation of microcontrollers in real operating conditions. The Eyring function has been used to take into account the temperature effect.
When designing the radio-electronic equipment for long-term operation in a space environment, one of the most important problems is a correct estimation of radiation stability of its electric and radio components (ERC) against radiation-stimulated doze failures and one-particle effects (upsets). These problems are solved in this paper for the integrated microcircuits (IMC) of various types that are...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.