Search results for: Jin Nam
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-6.1 - DG-6.3
Solid State Sciences > 2011 > 13 > 6 > 1360-1363
Solid State Electronics > 2011 > 56 > 1 > 219-222
IEEE Electron Device Letters > 2011 > 32 > 1 > 81 - 83