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Nano-roughened, sol–gel derived polycrystalline ZnO thin films prepared by a thermal ramping procedure were found to exhibit different work function values on a sub-micrometer scale. By Kelvin probe force microscopy (KPFM) two distinct nanoscale regions with work function differing by over 0.1eV were detected which did not coincide with the nano-roughened surface topography. In contrast, a flat ZnO...
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