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Precession Electron Diffraction (PED) has become a versatile tool of Transmission Electron Microscopy (TEM) for enhancing its nanoscale characterization abilities. In this contribution the advantages of PED are demonstrated on bulk samples of Phase Change Materials (PCM) with the nominal compositions Ge8Sb2Te11 and Ge8Bi2Te11. PED was applied in combination with High Resolution Transmission Electron...
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