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Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem via conservative assumptions is sub-optimal. Instead, operating systems may adapt task assignment and power management decisions to the variable characteristics of cores, improving system-wide power consumption and performance...
Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, thereby increasing delay. We propose scheduled voltage scaling, a technique that gradually increases the operating voltage of the IC to compensate for NBTI-related performance degradation. Scheduled voltage scaling has the potential...
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