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In this work, we propose a method to improve diagnosis results when multiple physical defects are present in circuits under diagnosis. To improve diagnosis results when multiple defects are present in a circuit under diagnosis, the proposed method includes (i) analyzing relations among locations of logic faults and their diagnostic metrics to carefully derive physical faults, (ii) a new set covering...
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-cycle scan test patterns. A diagnostic test generation flow to speed up diagnosis is proposed to address the issue of long run times of test generation and large number of test patterns for the cases where the range of suspected...
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the errors in responses due to defects which are captured in scan cells are not directly observed. We propose a simple and effective way to enhance the diagnostic resolution achievable by production tests with minimal increase...
Soft errors due to radiation are expected to increase in nanoelectronic circuits. Methods to reduce system failures due to soft errors include use of redundancy and making circuit elements robust such that soft errors do not upset signal values. Recent works have noted that electronic circuits have partial intrinsic immunity to soft errors since single event upsets on a large percentage of signal...
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