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This paper deals with a novel testing technique aimed at estimating the accuracy of analog-to-digital converters (ADCs). The main advantage of the proposed approach is the higher testing speed, particularly the ability to achieve an accurate estimate of the low-frequency component (LCF) of the integral nonlinearity (INL) pattern of an ADC in a time that may be even one order of magnitude shorter than...
This paper deals with a novel testing technique aimed at estimating the accuracy of analog-to-digital converters (ADC's). Compared with other valuable research results, the main advantage of the proposed approach is the higher testing speed, i.e. the ability of achieving an accurate estimate of the low frequency component of an INL pattern in a shorter time than other standard techniques such as the...
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