Search results for: K. Kukli
Journal of Electronic Materials > 2018 > 47 > 9 > 4938-4943
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2015 > 365 > PA > 61-65
Microelectronic Engineering > 2015 > 147 > C > 55-58
Thin Solid Films > 2015 > 591 > PA > 55-59
Microelectronics Reliability > 2014 > 54 > 9-10 > 1707-1711
2009 Spanish Conference on Electron Devices > 227 - 230
2009 Spanish Conference on Electron Devices > 223 - 226
Journal of Non-Crystalline Solids > 2008 > 354 > 2-9 > 404-408
Journal of Non-Crystalline Solids > 2008 > 354 > 2-9 > 393-398
Microelectronics Reliability > 2007 > 47 > 4-5 > 653-656
Microelectronics Reliability > 2005 > 45 > 5-6 > 949-952
Thin Solid Films > 2005 > 474 > 1-2 > 222-229
Journal of Crystal Growth > 2005 > 273 > 3-4 > 510-514
Nuclear Inst. and Methods in Physics Research, B > 2004 > 219-220 > Complete > 773-777
Solid State Electronics > 2003 > 47 > 10 > 1623-1629
Thin Solid Films > 2003 > 427 > 1-2 > 147-151
Nanostructured Materials > 1997 > 8 > 7 > 785-793