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The thickness of the adsorbed moisture layer on particulate surfaces is of interest because it directly influences the interaction between individual particles and, as a corollary, the mechanical behavior of the bulk powder assembly. A technique has been developed to measure the thickness of these layers on individual particles using atomic force microscopy (AFM). The approach takes account of the...
This paper reports on the morphology of poly(methyl methacrylate) (PMMA) films cast from chloroform (CHCl 3 ) and tetrahydrofuran (THF) onto tosylate-doped polypyrrole (PPyTos) surfaces. We have examined the bare and PMMA-coated PPyTos by X-ray photoelectron spectroscopy (XPS) to determine the surface composition and by atomic force microscopy (AFM) to characterize the surface morphology....
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