Search results for: J. Kątcki
Applied Surface Science > 2016 > 369 > C > 535-544
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > SOI Material Technologies > 91-96
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Scanning Electron and Scanning Probe Advances > 511-514
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Processed Silicon and Other Device Materials > 375-378
Materials Science & Engineering B > 2015 > 199 > Complete > 42-47
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2015 > 348 > C > 106-110
Polish Journal of Chemical Technology > 2014 > Vol. 16, nr 3 > 40--44
Acta Physica Polonica A > 2014 > 125 > 4 > 1027-1032
Journal of Microscopy > 237 > 3 > 379 - 383
Journal of Microscopy > 237 > 3 > 242 - 245
Journal of Microscopy > 237 > 3 > 347 - 351
Journal of Microscopy > 237 > 3 > 304 - 307
Journal of Microscopy > 237 > 3 > 325 - 328
Acta Physica Polonica A > 2009 > 116 > S > S-89-S-91
Acta Physica Polonica A > 2009 > 116 > S > S-86-S-88
Materials Science & Engineering B > 2008 > 154-155 > Complete > 175-178
Nuclear Inst. and Methods in Physics Research, B > 2006 > 253 > 1-2 > 274-277