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Grazing incidence angle in-plane X-ray diffraction (in-plane XRD) was applied to characterization of an organic-inorganic hybrid Langmuir-Blodgett (LB) film in a laboratory scale. The hybrid LB film consisted of octadecyl ammonium cation and sodium montmorillonite layers at Si(100) wafer. The in-plane XRD measurements of the hybrid LB film gave one diffraction peak at 20.0 o (0.44 nm), which...
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