Search results for: J. E. E. Baglin
Microelectronics Reliability > 1996 > 36 > 3 > 455
IEEE Transactions on Nuclear Science > 1981 > 28 > 3-2 > 3378 - 3379
IEEE Transactions on Nuclear Science > 1973 > 20 > 3 > 932 - 933
IEEE Transactions on Nuclear Science > 1971 > 18 > 3 > 572 - 574