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A novel diffraction sensor geometry able to provide the diffraction pattern of a suspect material without prior knowledge of the samples location is introduced. The sensor geometry can also resolve diffraction patterns originating from multiple unknown materials overlapped along the primary X-ray beam path. This is achieved through tracking Bragg peak maxima that linearly propagate from the inspection...
We introduce a novel method for identifying materials using a series of X-ray diffractograms collected in transmission. A multiple perspective approach is used to identify the diffractograms produced by materials located at different positions along the primary X-ray beam. This technique promises to enhance materials identification performance in cluttered environments such as those prevalent in aviation...
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