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For advanced technology, the current industry is seeing very complicated silicon defect types and defect distribution. It is very common for the yield of a new design to start at a very low level and it's critical to ramp up yield as quickly as possible to meet the market window. During manufacturing stage for volume production, yield excursions do occur and the yield needs to be improved to a stabilized...
Dialect conversion is one of the most important aspects of Chinese speech synthesis. A Lanzhou dialect corpus has been built based on “word-list in dialectal survey” for the conversion of Lanzhou dialect from Mandarin. Speech corpus was recorded with contrastive (Lanzhou dialect vs. Mandarin) recordings. Five Degrees Tone Model based f0 models and statistical based duration and pause duration model...
As technologies move below 130nm, the IC industry has seen a significant change in defect type encountered. Feature-related defects are becoming more prevalent than particle-driven defects in nanometer designs. The process and design variances require checks for the design-for-manufacturing (DFM) issues in order to achieve a high yield. Scan diagnosis targeted for the nanometer designs can provide...
Diagnosis of scan test fail data plays a crucial role in enhancing ramp up of new CMOS technology generations. To enable faster feedback it is preferable to establish a monitoring diagnosis methodology on the production test floor. This paper reports result of a study on using test time optimized compressed scan technology and associated new algorithms for fault diagnosis. Data is based on a system-on-a-chip...
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