Search results for: J. Chen
IEEE Electron Device Letters > 2017 > 38 > 7 > 929 - 932
2016 IEEE International Electron Devices Meeting (IEDM) > 10.4.1 - 10.4.4
IEEE Electron Device Letters > 2017 > 38 > 7 > 929 - 932
2016 IEEE International Electron Devices Meeting (IEDM) > 10.4.1 - 10.4.4