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We present results of an extensive study on broad area lasers (BALs) with different antireflection (AR) coatings in the wavelength range from 780 nm to 1020 nm, which have been investigated under external optical feedback (EOF) to detect reversible and irreversible impacts caused by back-reflected laser radiation. The observation of the near-field (NF) distribution vs. injection current gave us information...
Catastrophic facet degradation at highest power levels is analyzed for different diode laser waveguide architectures. Degradation events at front and rear facet are analyzed and predominant damage at the rear is elucidated for Al-free waveguides.
Kinetics of catastrophic optical damage in diode lasers is monitored for 650, 808, and 980 nm emitting devices. The power-decay time-constants after degradation increase with wavelength pinpointing the better thermal properties of 980 nm barrier/waveguide materials.
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