Search results for: X. Chen
2015 IEEE International Reliability Physics Symposium > MY.2.1 - MY.2.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 9 - 12
2011 Electrical Insulation Conference (EIC). > 434 - 438
IEEE Electron Device Letters > 2010 > 31 > 5 > 396 - 398