Search results for: H. Chen
Measurement > 2017 > 108 > C > 171-192
Electronics Letters > 2017 > 53 > 20 > 1373 - 1375
2016 IEEE International Electron Devices Meeting (IEDM) > 27.4.1 - 27.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 26.2.1 - 26.2.4
Nuclear Instruments and Methods in Physics Research Section A: Accelerators,... > 2015 > 784 > C > 44-50
IET Electric Power Applications > 2015 > 9 > 4 > 319 - 331
2015 IEEE International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4