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Simultaneous switching noise (SSN) is caused by the simultaneous switching of a group of I/O drivers, and is proportional to the total inductance and the rate of change of the switching current. This often leads to signal distortion and degradation of signal and power integrity of systems. Furthermore, with the continuously decreasing operating voltage, susceptibility to SSN keeps on increasing and...
Simultaneous switching current (SSC) drawn by integrated circuits (ICs) creates simultaneous switching noise (SSN) on power nets, which causes a number of SI/PI problems, such as reduced noise margin and eye opening with increased SSN. Analyzing the effects of SSC and SSN is especially important for ICs targeted for mobile applications whose operating frequency keeps on increasing with decreasing...
A simultaneous switching current (SSC) drawn by an integrated circuit (IC) creates simultaneous switching noise on power nets, which in turn causes jitters in the I/O signals and reduces the maximum clock frequency. For a thorough analysis of high-speed ICs, there is a dire need to measure currents at specific power pins of the ICs. In this paper, a novel magnetically coupled embedded current probing...
The importance of current detection has been highlighted with the introduction of 3D-IC, in order to ensure the safe and reliable operation of analog circuits in mixed-signal systems. In this paper, we propose toroidal current probe embedded in multi-layer printed circuit boards (PCBs) for current detection. Current is magnetically coupled to the proposed current probe and the transfer impedance between...
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