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Diagnosis for delay defects becomes more significant as the CMOS process advances to nanometer regime. The most challenging problems of delay fault diagnosis in nanometer process come from the process variation, which results in small delay variations. Small delay variations are difficult to be diagnosed by using existing methods based on a specific fault model. This paper presents a new estimation...
Timing yield, in conjunction with other types of yield, directly affects profit; under-estimation is as bad as over-estimation, because large amount of time is unnecessarily spent to increase small amount of timing yield. The correlation that stems from clock network, when ignored, turns out to be one of the reasons of under-estimation in clocked sequential circuit. Three sources of topological correlation...
For the multisensor systems with unknown noise variances, based on the solution of the matrix equations for the correlation function, the on-line estimators of the noise variance matrices are obtained, whose consistency is proved using the ergodicity of sampled correlation function. Further, two self-tuning weighted measurement fusion Kalman filters are presented for the multisensor systems with identical...
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