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A new current sweep measurement method is introduced to investigate the details of the set process. The electrode-dependent current compliance failure phenomenon is investigated in oxide-based resistive switching memory. The results indicate that the amount of conductive filaments formed in the oxide layer is the critical factor that influences the set behavior (sudden or slowly) and causes the compliance...
A novel cell analysis technique based on the measurement of the electrical characteristics of a cell is described in this paper. Impedance is obtained by applying an impulse to a cell in suspension as it passes through an aperture and recording the impulse response.
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