Search results for: Peng Yu
Journal of Electronic Testing > 2017 > 33 > 2 > 261-266
Electronics Letters > 2016 > 52 > 14 > 1261 - 1262
Electronics Letters > 2016 > 52 > 12 > 1076 - 1078
IEEE Microwave and Wireless Components Letters > 2015 > 25 > 1 > 34 - 36
IEEE Microwave and Wireless Components Letters > 2013 > 23 > 12 > 662 - 664
2010 International SoC Design Conference > 311 - 314
IEEE Microwave and Wireless Components Letters > 2009 > 19 > 9 > 575 - 577
IEEE Microwave and Wireless Components Letters > 2007 > 17 > 7 > 528 - 530