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Infrared Fourier transform spectroscopy has been used to investigate phonon and plasmon modes in Cd1-xHgxTe and CdTe thin layer on GaAs substrate. Attenuated total reflection (ATR) spectroscopy has been used to excite surface plasmon and phonon polaritons. The plasmon-LO phonon coupling modes in samples are studied by dispersion curve calculation for various carrier concentrations. There exist three...
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