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The advent of hard X‐ray free‐electron lasers enables nanoscopic X‐ray imaging with sub‐picosecond temporal resolution. X‐ray grating interferometry offers a phase‐sensitive full‐field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is attractive for imaging applications at X‐ray free‐electron lasers where intrinsic pulse‐to‐pulse fluctuations...
Herein, the high temperature stack oxidation (HiTSOx) approach for the fabrication of passivated emitter and rear cells (PERCs) is investigated. This approach features a combination of phosphorus oxychloride (POCl3) diffusion shortened to the phosphosilicate glass (PSG) deposition phase as well as high temperature thermal oxidation using stacked wafers. During the latter thermal oxidation, the incorporated...