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Microwave impedance microscopy (MIM) is a novel scanning probe technique used to measure local electrical impedance under an AFM tip operating at some fixed electrical resonant frequency. Each point in the surface scan records sample elevation and power return loss, thus generating a topographical image with an overlaid impedance map. Various high specific surface area (SSA) carbon materials, recently...
Ultrafine fibers were spun from polyacrylonitrile (PAN)/N,N-dimethyl formamide (DMF) precursor solution using a homemade electrospinning setup, and then pyrolyzed in vacuum at 873, 1073, 1273 and 1473K, respectively. The pyrolyzed fibers, with diameter of the order of 100nm as revealed by a scanning electron microscope (SEM), were characterized using Raman microspectrometry. Their Raman scattering...
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