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Ideally, it is assumed that a system fails as soon as one of its components connected in series has failed. However, in many real-world system configurations do not allow the system failure immediately when a fault or component failure occurs, rather its reliability falls down at a faster rate, and soon the system fails prematurely. If the fault is rectified or the failed item is repaired within a...
This paper introduces for the first time a new test structure for electromigration which allows increased statistics and reliability tests in a testchip under typical High Temperature Operating Life experimental ranges. Following the electrical analysis, a large panel of failure analysis methodologies was suitably used to categorize defects such as size, location, resistance impact, etc. This thorough...
Static Random Access Memories (SRAMs) are present nowadays in all CMOS products in large quantities. Besides, they are often very challenging both on process side (due to small dimensions) and on design side (due to performance request). As a consequence, managing their reliability is of prime importance, though it is quite complex due to their overall complexity. This paper demonstrates a full reliability-based...
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