Search results for: Bowen Wang
Microelectronics Reliability > 2015 > 55 > 7 > 1046-1053
IEEE Transactions on Dielectrics and Electrical Insulation > 2014 > 21 > 3 > 957 - 963
IEEE Transactions on Plasma Science > 2013 > 41 > 10-2 > 3063 - 3068