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Body bias effects on the laser-induced transient current peak, duration, collected charge and amplification factor are experimentally evaluated. The results are promising for radiation-hardened circuit design.
Single Event Transients (SETs) are a growing concern in advanced integrated circuits yet techniques to accurately characterize the cross-section and pulse width of SETs are less mature than those for measuring SEUs. We present four circuits for measuring SETs, an analysis of their capabilities and the subtleties in their implementation. Post-layout circuit simulation results are presented for a test-chip...
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