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Scan is a widely used Design-for-Testability technique to improve test and diagnosis quality. Many defects may cause scan chains to fail. In this paper, an observation point oriented Deterministic Diagnostic Pattern Generation (DDPG) method was proposed for compound defects, which tolerates the system defects during scan chain diagnosis. Instead of sensitizing multiple paths proposed in our prior...
In this paper, we study the impact, detection and diagnosis of the defect inside a scan cell, which is called scan cell internal defect. We first use SPICE simulation to understand how a scan cell internal defect impacts the operation of a single scan cell. To study the detectability and diagnosability of a scan cell internal defect in a production test environment, we inject scan cell internal defects...
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