Search results for: Wei Ren
2009 International Conference on Test and Measurement > 1 > 404 - 407
IEEE Photonics Technology Letters > 2009 > 21 > 2 > 103 - 105
IEEE Photonics Technology Letters > 2008 > 20 > 24 > 2138 - 2140
2009 International Conference on Test and Measurement > 1 > 404 - 407
IEEE Photonics Technology Letters > 2009 > 21 > 2 > 103 - 105
IEEE Photonics Technology Letters > 2008 > 20 > 24 > 2138 - 2140