The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Spectroscopic ellipsometry (SE), high resolution transmission electron microscopy (HRTEM), atomic force microscopy (AFM) and optical transmittance measurements were used to study and establish a correlation between the open-circuit voltage (Voc) of solar cells and the p-layer optical band gap (Ep). It is found that the ellipsometry measurement can be used as an inline non-destructive diagnostic tool...
Spectroscopic ellipsometry was used to optimize p-layer deposition for silicon-based thin film solar cells. It is found that the p layer with a double-layer structure with increased boron-doping gives the highest open-circuit voltage (Voc) of 1.03 V for hydrogenated amorphous silicon (a-Si:H) solar cells. Together with atomic force microscopy and optical transmittance measurements, the cell performance...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.