Search results for: Young‐Jin Kim
IEEE Journal of the Electron Devices Society > 2017 > 5 > 6 > 432 - 444
IEEE Journal of the Electron Devices Society > 2017 > 5 > 3 > 193 - 208
IEEE Journal of the Electron Devices Society > 2017 > 5 > 6 > 432 - 444
IEEE Journal of the Electron Devices Society > 2017 > 5 > 3 > 193 - 208