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In this paper, experimental methods are emphatically described for measuring the proton single event effects (SEE) in Xilinx Zynq-7010 system-on chip. Experimental data are presented showing that low energy (3MeV≤Energy≤10MeV) proton irradiation can cause single event effects in different hardware blocks of Xilinx Zynq-7010 SoC, including D-Cache, programmable logic (PL), arithmetic logical unit (ALU),...
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