Search results for: Xiao Sun
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2888 - 2893
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 463 - 479
IEEE Electron Device Letters > 2012 > 33 > 3 > 438 - 440
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2888 - 2893
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 463 - 479
IEEE Electron Device Letters > 2012 > 33 > 3 > 438 - 440