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Retention error has been recognized as the most dominant error in MLC (multi-level cell) flash. In this paper, we propose a new approach called PISO (Programming Initial Step Only) to reduce its number. Unlike a normal programming operation, a PISO operation only carries out the first programming-and-verifying step on a programmed cell. As a result, a number of electrons are injected into the cell...
Manufacturers are continuously pushing NAND flash memory into smaller geometries and enforce each cell to store multiple bits in order to largely reduce its cost. Unfortunately, these scaling down techniques inherently degrade the endurance and reliability of flash memory. As a result, permanent errors such as block or die failures could occur with a higher possibility. While most transient errors...
Due to resource constraints, digital image transmissions are a significant challenge for image sensor based wireless sensor networks (WSN). In this paper, we propose a novel robust and energy-efficient scheme, called image component transmission (ICT) in WSN by providing various levels of reliability during image transmissions. Essential components such as the information for the positions of significant...
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