The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The thermal stability of silver thin films between 100nm and 820nm thick deposited onto single crystal yttria-stabilised zirconia (YSZ) substrates by evaporation was investigated by annealing the films between 250°C and 550°C for different durations. Films approximately 100nm thick were thermally unstable at temperatures as low as 250°C. A dewetting process occurred in which grain boundaries ruptured,...
A numerical method developed originally for calculating the edge-induced relaxation of film stress in a semi-infinite thin film, and the corresponding stresses induced in the substrate, is extended to apply to stripes of finite width 2l and thickness h. Values of relaxation are obtained by numerical integration for several values of the ratio R = Kl/h (K depends on the elastic constants of the film...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.